Function：Put the spliced crystal bar and flitch together on YX-6F orientation instrument, let the bottom of flitch rely on base surface of regular instrument, open the optical shutter to do rechecking measurement. YX-6F can do recheck measurement of X axis for spliced crystal bar, the result can be compared with print result by YX-6D, if happen difference, can remove the crystal bar from flitch and splice again, make sure splice accuracy of crystal bar before cutting.
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X-ray tube |
copper target with anode grounding, force air cooling |
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Tube voltage |
30KVP，switch closed under full voltage |
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Tube current |
0---5mA，continuous adjustable. |
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Input power |
Not over 0.3KW |
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Orientation accuracy |
±30″ |
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Worm gear running error |
Not over 30″ |
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Counter rotation angle |
-10°------+100° |
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Sample rotation angle |
-10°------+50° |
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Counter tube |
Geiger tube, voltage of 600-----1100V |
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Time constant |
0.1、0.4、3second; 3levels adjustable |
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Protection |
High voltage interlock protection, temperature protection |
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slit |
4′、5′、6′ |
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Outer dimension |
1200mm×650mm×1100mm |
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Equipment weight |
250KG |
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Sample diameter |
Silicon single crystal Φ3---Φ8inch silicon wafer； |
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Measured crystal bar length |
Silicon single crystal Φ3—8inch；500mm length crystal bar |
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